Electron Microscopy

The JEOL JSM 6480 SEM is a Scanning Electron Microscope (SEM) used for high-resolution surface imaging. Supports both assisted and independent operation modes. Available for internal and external users at UNC Charlotte. Training required before non-assisted usage. Used extensively in materials science and nanotechnology research.

Usage & Fees: 

• Assisted Use: $76/hr (Internal), $125/hr (External)
• Non-Assisted Use: $25/hr (Internal), $48/hr (External)
• Training Fee: $114/user (Internal), $188/user (External)

Equipment Location: Grigg 147 / Duke 240

An Energy Dispersive X-ray Spectroscopy (EDS) system used for elemental analysis and chemical characterization. Typically paired with SEM for precise surface composition analysis. Offers both assisted and independent operation options. Available for research use by internal and external users. Requires training prior to non-assisted access. Located in core research labs supporting materials science and engineering.

Usage & Fees: 

• Assisted Use: $76/hr (Internal), $125/hr (External)
• Non-Assisted Use: $25/hr (Internal), $48/hr (External)
• Training Fee: $114/user (Internal), $188/user (External)

Equipment Location: Grigg 147 / Duke 240

A high-resolution Transmission Electron Microscope (TEM) for imaging internal structures at the nanoscale. Utilizes LaB6 electron source for enhanced brightness and stability. Ideal for crystallographic, morphological, and compositional studies. Requires substantial training due to the complexity of operation.

Usage & Fees: 

• Assisted Use: $68/hr (Internal), $137/hr (External)
• Independent Use: $31/hr (Internal), $82/hr (External)
• Training Fee: $400/user (Internal), $806/use (External)

Equipment Location: Grigg 147