Scanning Electron Microscopy (SEM)

The JEOL JSM 6480 SEM is a Scanning Electron Microscope (SEM) used for high-resolution surface imaging. Supports both assisted and independent operation modes. Available for internal and external users at UNC Charlotte. Training required before non-assisted usage. Used extensively in materials science and nanotechnology research.

Usage & Fees: 

• Assisted Use: $76/hr (Internal), $125/hr (External)
• Non-Assisted Use: $25/hr (Internal), $48/hr (External)
• Training Fee: $114/user (Internal), $188/user (External)

Equipment Location: Grigg 147 / Duke 240

An Energy Dispersive X-ray Spectroscopy (EDS) system used for elemental analysis and chemical characterization. Typically paired with SEM for precise surface composition analysis. Offers both assisted and independent operation options. Available for research use by internal and external users. Requires training prior to non-assisted access. Located in core research labs supporting materials science and engineering.

Usage & Fees: 

• Assisted Use: $76/hr (Internal), $125/hr (External)
• Non-Assisted Use: $25/hr (Internal), $48/hr (External)
• Training Fee: $114/user (Internal), $188/user (External)

Equipment Location: Grigg 147 / Duke 240

The Denton Desk IV Coater is a compact, benchtop sputter coater designed for SEM/TEM sample preparation. It provides uniform, fine-grain conductive coatings like gold, platinum, or carbon using magnetron sputtering or optional carbon evaporation. The system includes built-in vacuum pumps and supports features like rotation, tilt, and etching for precise thin-film deposition. Ideal for high-resolution imaging, it ensures low-temperature operation to protect delicate samples.

Usage & Fees: 

• Assisted Use: $41/hr (Internal), $67/hr (External)
• Non-Assisted Use: $5/hr (Internal), $12/hr (External)
• Training Fee: $41/user (Internal), $67/user (External)

Equipment Location: Duke 240